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2008 IEDM Technical Program
Select sessions below to view online, or download PDF version (419 KB).
Session 2: Process Technology - High-k Metal-Gate Integration
Session 3: CMOS Devices and Technology - Advanced Transport Enhancement
Session 4: Displays, Sensors and MEMS - Thin-Film Devices and Memory
Session 5: Characterization, Reliability, and Yield - BTI in SiON and High k FETs
Session 6: Quantum, Power, and Compound Semiconductors Devices - High-Voltage Power Devices
Session 7: Solid State and Nanoelectronic Devices - Spin Devices, Batteries and Steep Slope FETs
Session 8: Modeling and Simulation - Advances in Modeling Low Dimensional Structures
Session 9: Memory Technology - Phase-Change and Unified Memory
Session 10: CMOS Devices and Technology - Vth Variation and Scaling
Session 11: Displays, Sensors, and MEMS - Imaging Technologies
Session 12: Memory Technology - Resistive Memory and Magnetic Memory
Session 13: Emerging Technologies - Nanotechnologies for Medicine and Biology
Session 14: Characterization, Reliability, and Yield - ESD/Memory Reliability
Session 15: Quantum, Power, and Compound Semiconductor Devices - III-V MOSFETs with High K Dielectrics
Session 16: Process Technology - Ge-Channel CMOS and Advanced Gate Stacks
Session 17: Special Session - Issues at the Confluence of Technology and Design
Session 18: Characterization, Reliability, and Yield - Strain Optimization and Performance
Session 19: Quantum, Power, and Compound Semiconductors Devices - RF Power and Optoelectronic Devices
Session 20: Displays, Sensors, and MEMS - Biosensors and 3D Hetero Integration
Session 21: Solid State and Nanoelectronic Devices - Carbon-Based Devices
Session 22: Modeling and Simulation - Atomistic Process Simulation and Memory Modeling
Session 23: CMOS Devices and Technology - Characteristics of Mobility and Threshold Voltage in Advanced Devices
Session 24: 2008 IEDM Special Evening Session
Session 25: 2008 IEDM Evening Panel Discussion
Session 26: Process Technology - Interconnect and 3D-IC Technologies
Session 27: CMOS Devices and Technology - Advanced CMOS Logic and SoC Platforms
Session 28: Displays, Sensors, and MEMS - MEMS Actuators and Resonators
Session 29: Modeling and Simulation - Variability Modeling and Technology Optimization
Session 30: Quantum, Power, and Compound Semiconductors Devices - Heterostructure High-Speed Devices
Session 31: Solid State and Nanoelectronic Devices - Silicon Nanowire Transistors
Session 32: Characterization, Reliability, and Yield - Defect Characterization and Dielectric Breakdown
Session 33: Memory Technology - DRAM and NOR Flash Memory
Session 34: Memory Technology - Nanoscale Poly-FG and Charge Trap Flash Non-Volatile Memories
Session 35: CMOS Devices and Technology - Alternative MOSFET Device Architectures and Materials
Session 36: Modeling and Simulation - Enhanced Mobility and III-V Devices
Session 37: Process Technology - Advanced Source-Drain Engineering and Memory Processing - Enhanced Mobility and III-V Devices