Printable résumé
Skills
- Experimental
-
Molecular beam epitaxy (MBE), reflection high energy electron
diffraction (RHEED), atomic force microscopy (AFM), diffuse reflectance
spectroscopy (DRS), x-ray diffraction (XRD), photoluminescence
(PL), photolithography.
- Programming
-
C/C++, Tcl, FORTRAN, Object Pascal, Mathematica, IGOR Pro.
Macintosh, Windows, Unix.
Experience
- National Institute of Standards and Technology,
- Gaithersburg, MD,
1997-present
- Developing phase-field model of electrodeposition in
trenches
for copper-damascene integrated circuits.
- Exploited DRS and RHEED for surface science and growth
characterization.
- Implemented in situ DRS for improved temperature control during
MBE growth of pseudomorphic high electron mobility
transistors (pHEMTs).
- Northwestern University,
-
Evanston, IL, 1991-7
- Developed first linear stability model of heteroepitaxial alloy thin
film growth.
- Successfully tested theory by depositing
III-V semiconductor thin films using MBE. Characterized
evolution of strain and morphology
using reflection high energy electron
diffraction and atomic force microscopy.
- Teaching assistant for phase transformations in materials.
- Electrotechnical Laboratory,
- Tsukuba, Japan, 1995 NSF Summer Institute in Japan
- Studied Japanese language and collaborated
with Japanese scientists to grow and characterize
SiGe films.
- United States Navy,
- Nuclear Powered Submarine,
USS Casimir Pulaski (SSBN-633) BLUE, 1986-91
- Achieved rank of Lieutenant (O-3).
- Supervised and instructed up to 50 in
nuclear reactor operations, quality assurance, and weapons systems.
Education
- PhD, Northwestern University,
- Evanston, IL
Materials Science and Engineering Dissertation: ``Stability of Alloy Thin Films''
Advisors: Prof. Peter W. Voorhees and Prof. Scott A. Barnett
- Naval Nuclear Propulsion School,
- Orlando, FL
and S5G Prototype Reactor, Idaho Falls, ID
Intensive, year-long, practical and theoretical training in nuclear
reactor operations
- BS, Northwestern University,
- Evanston, IL
Materials Science and Engineering Thesis: ``Temperature Dependence of Photoluminescence in InP/InAsP
Strained Layer Superlattices''
Advisors: Dean Jerome B. Cohen and Prof. Bruce W. Wessels
Honors
- National Research Council Postdoctoral Associateship, 1997-99
- Materials Research Society Graduate Student Award for
Outstanding Research, 1996
- National Defense Science and Engineering Graduate Fellowship,
1991-94
- Navy Achievement Medal, 1991
- National Merit Scholarship, 1982-86
- Naval Reserve Officer Training Corps Scholarship, 1982-86
Memberships
- Materials Research Society
- American Association for Crystal Growth
- Society for Industrial and Applied Mathematics
Publications
- ``Morphological Stability of Alloy Thin Films'',
by J. E. Guyer and P. W. Voorhees
Phys. Rev. Lett. 74, 4031 (1995)
- ``The Stability of Lattice Mismatched Thin Films'',
by J. E. Guyer and P. W. Voorhees
In Evolution of Epitaxial Structure and Morphology,
MRS Symposia Proceedings 399, p. 351,
edited by A. Zangwill, D. Jesson, D. Chambliss, and R. Clarke
(Materials Research Society, Pittsburgh, PA, 1995)
- ``Morphological Stability of Alloy Thin Films'',
by J. E. Guyer and P. W. Voorhees
Phys. Rev. B 54, 11710 (1996)
- ``Morphological Stability and Compositional Uniformity of Alloy
Thin Films'',
by J. E. Guyer and P. W. Voorhees
J. Crystal Growth 187, 150 (1998)
- ``Are You Being Served? Version Management for the Well-appointed
Developer'',
by Jonathan Guyer
MacTech Magazine 15(11), 16 (1999)
- ``Morphological Evolution of InGaAs Grown Under
Compression on GaAs(001) and Under Tension on InP(001) by Molecular
Beam Epitaxy'',
by J. E. Guyer, S. A. Barnett, and P. W. Voorhees,
J. Crystal Growth 217, 1 (2000)
- ``Real-time measurements of the pseudodielectric function
of low-temperature-grown GaAs'',
by D. A. Gajewski, J. E. Guyer, and J. G. Pellegrino,
Appl. Phys. Lett. 77(4), 540 (2000)
- ``Diffuse Reflectance Spectroscopy for In Situ
Process Monitoring and Control During Molecular Beam Epitaxy
Growth of InGaAs/AlGaAs Pseudomorphic High Electron Mobility
Transistors'', by J. E. Guyer, W. F. Tseng, and
J. G. Pellegrino,
J. Vac. Sci. Technol. B 18(5), 2518 (2000)
- ``In Situ Surface Preparation of InP(001) by
Glancing-Angle 1 keV Ar Bombardment'', by J. E. Guyer,
J. G. C. Labanda, M. R. Pillai, P. M. DeLuca, and
S. A. Barnett (in preparation)
- ``GaAs(001) Surface Reconstructions as Functions of Substrate
Temperature and As:Ga Flux Ratio'',
by J. E. Guyer, D. A. Gajewski, and J. G. Pellegrino
(in preparation)
Presentations
- ``The Morphological Stability of Coherent, Binary Alloy,
Epitaxial Films'',
by J. E. Guyer and P. W. Voorhees
Materials Research Society 1994 Fall Meeting
- ``Morphological Stability of Alloy Thin Films'',
by J. E. Guyer and P. W. Voorhees
1995 Workshop on Strains and Epitaxial Growth, Tsukuba, Japan
- ``Compositional Stability of Alloy Thin Films'',
by J. E. Guyer, S. A. Barnett, and P. W. Voorhees
American Vacuum Society 1996 Meeting
- ``Compositional Stability of Alloy Thin Films'',
by J. E. Guyer, S. A. Barnett, and P. W. Voorhees
Materials Research Society 1996 Fall Meeting
- ``Stability of Alloy Thin Films'',
by J. E. Guyer, S. A. Barnett, and P. W. Voorhees
1997 Gordon Research Conference:
Thin Film and Crystal Growth Mechanisms (poster)
- ``Morphological Stability and Compositional Uniformity of Alloy
Thin Films'',
by J. E. Guyer, S. A. Barnett, and P. W. Voorhees,
1998 NSF-IMM Symposium on Micromechanic Modeling of Industrial Materials
- ``Diffuse Reflectance Spectroscopy for In Situ Process
Monitoring and Control During III-V Molecular Beam
Epitaxy'',
by J. E. Guyer, D. A. Gajewski, and J. G. Pellegrino,
1998 East Coast MBE Users Group Meeting
- ``In Situ Diffuse Reflectance Spectroscopy for
Measurement and Control During III-V Molecular Beam Epitaxy'',
by J. E. Guyer, W. F. Tseng, W. R. Thurber, E. M. Vogel,
D. A. Gajewski, and J. G. Pellegrino,
Materials Research Society 1999 Fall Meeting (nominated for best poster)
- ``Diffuse Reflectance Spectroscopy and Reflection High
Energy Electron Diffraction to Measure GaAs(001) Surface
Reconstructions During Molecular Beam Epitaxy as Functions of
Substrate Temperature and V:III Ratio'',
by J. E. Guyer, D. A. Gajewski, and J. G. Pellegrino,
Twelfth American Conference on Crystal Growth and Epitaxy, 2000
File translated from TEX by TTH, version 2.21. On 27 Oct 2000, 15:28.
|